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TITLE PAGE

                            CONSTRUCTION OF 555 TIMERS AND 741 IC TESTER        

BY

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EE/H2013/01430
DEPARTMENT OF ---
SCHOOL OF ---
INSTITUTE OF ---

DECEMBER,2018

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APPROVAL PAGE

This is to certify that the research work, "construction of 555 timers and 741 ic tester" by ---, Reg. No. EE/H2007/01430 submitted in partial fulfillment of the requirement award of a B.Sc on --- has been approved.

By
Dr. ---                                                    Dr. ---
Supervisor                                                  Head of Department.
Signature……………….                           Signature……………….        

……………………………….
 Dr. ---
External Invigilator

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DEDICATION
This project is dedicated to Almighty God for his protection, kindness, strength over my life throughout the period and also to my --- for his financial support and moral care towards me.Also to my mentor --- for her academic advice she often gives to me. May Almighty God shield them from the peril of this world and bless their entire endeavour Amen.

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ACKNOWLEDGEMENT

The successful completion of this project work could not have been a reality without the encouragement of my --- and other people. My immensely appreciation goes to my humble and able supervisor mr. --- for his kindness in supervising this project.
My warmest gratitude goes to my parents for their moral, spiritual and financial support throughout my study in this institution.
My appreciation goes to some of my lecturers among whom are Mr. ---, and Dr. ---. I also recognize the support of some of the staff of --- among whom are: The General Manager, Deputy General manager, the internal Auditor Mr. --- and the ---. Finally, my appreciation goes to my elder sister ---, my lovely friends mercy ---, ---, --- and many others who were quite helpful.

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Integrated circuits (ICs) are the main component of each and every electronic circuit can be used for wide variety of purposes and functions. But sometime due to faulty ICs the circuit doesn’t work. Indeed it is lot tedious work to debug the circuit and confirm whether the circuiting is creating problem or the IC itself is dead. So to come up with these sorts of problems we intend to make a project which would confirm whether the IC under consideration is working properly or not. The purpose of testing is for measurement  of defects  and  quality level and each integrated circuit must be thoroughly checked in order to verify it  will function as designed. Hence this project titled “555 TIMERS AND 741 OP-AMPS INTEGRATED CIRCUIT  TESTER”  is designed to  enable electronic circuit  designers,  vendors  of  electronic  components,  even laboratories and schools to  design  workable  circuits  by making sure that the  ICs used  are functioning  properly.  This  integrated  circuit  tester will  be able  to test 555 timers and 741 op-amps.
                                                                                                            

CHAPTER ONE
1.1                                                        INTRODUCTION
In any manufacturing industry, there are continuous  efforts  to reduce  cost,  upgrade  quality and improve overall efficiencies. In electronic industries, with the dramatic increase in circuit complexity and the need for the higher levels of reliability, a major contributor cost in  any product can be in the testing. The purposes of testing is for measurement  of defects and  quality  level and Each integrated circuit that leaves the factory  must  be thoroughly  checked in  order to verify  it will function as designed However, taking into consideration that, in the real world, no product  is perfect, testing will be an essential part of production in  the  foreseeable  future.  In industries, research centers and colleges where some common ICs are frequently used; many times have difficulties due to some faults in these integrated circuits. This makes it  so essential  to test them before using them in  hardware  implementation.  Hence  Integrated  circuit  tester is  a good  solution for these problems. This tester will be able to test 555 timers and 741 operational amplifier integrated circuits (i.c).

1.1                                   BACKGROUND OF STUDY
The dramatic increase in the use of digital integrated circuit (ICs) has  created  a need  for  a fast accurate means of testing such  ICs. A test  of an IC  is  a process which  enables  to determine  if  an IC is functioning properly. In the context of our country, most ICs bought  in  the  market  are considered functional. Thereby not subjected  to any test before  being  used in  a project.  However, the fact that an IC has never been used  doesn’t  guarantee  its  functioning  properly  and  it  takes a long time to debug and identify a failure in a circuit in which new components have  just  been introduced. An IC tester is to be economically implemented  for  small  or medium-scale  users  of such ICs (for example, in the lab, and electronic workshops)
And provides a quick but thorough check of its  functions  with  minimal  operator  action.  The  IC tester can be used to test different ICs. The purpose  of the IC tester is  to ensure  IC components  are in good condition for use. To test an IC, different hardware circuits for different ICs are needed.
Hence it is needful to construct an IC tester in order to identify and  separate healthy  components from faulty ones.

1.2                                     PROBLEM STATEMENT
Integrated Circuits are the  main  components of each and  every electronic  circuit  and can be used for wide variety and purposes. But sometimes due to faulty IC, the electronic circuit does not work. Since it is tedious work to debug the electronic circuit and to confirm whether it is the circuiting creating the problem or the IC is defective  and the degree of the defect.  An Integrated Circuit  tester  is necessary to confirm whether the IC to be used is functioning properly.

1.3                                       AIM / OBJECTIVE OF THE PROJECT
The main aim of this work is to conceive  and realize  a digital  integrated  circuit  which  can test basic ICs such 555 timers and 741 operational amplifier integrated circuits (i.c).
Specific objectives.

• To test 555 timers and 741 operational amplifier integrated circuits (i.c)
•  To   test  NE55  timer    and OPAM  circuits like    lm741    with  or  without the use of a microcontroller.
• To be able to detect the degree of defect found in the logic ICs.
• To increase the efficiency of Practical conducted in our school laboratory
• To make the realization of circuits in secondary and university institutions  easy  and reliable.

1.4                                             MOTIVATION

The IC testers available in the market today are too costly for individuals to own.  Therefore we decided to construct an IC tester which is affordable and user-friendly.  The motivation is to build an affordable IC tester which is able to test the functioning of OP Amp integrated circuits - LM741, and  ICs NE555. The test sequence provided in the data base facilitates the detection of defective ICs. Furthermore, the tester must be easy to   operate, compact, lightweight,

1.5                                          APPLICATION OF THE PROJECT
This is very useful for testing 555 timers and 741 op-amps used in circuits used by:

• Electronics designers
• Electronics hobbyist
• vendors  of  electronic  components
• Electronics workshop and also, it can be used in Electronics lab.

1.6                                         SIGNIFICANCE OF THE PROJECT
If a constructed circuit with 555 timers and 741 op-amp is not giving proper output means we can check every component in the circuit and can change faulty one with this circuit. It saves time and human effort for testing the IC giving out the result instantaneously. The tester is easy to   operate, compact, lightweight.

1.7                                 LIMITATION  OF  THE STUDY.

This project is limited to designing and implementing an integrated circuit tester for 555 timers and 741 op-amp.

1.8                                                  SCOPE OF THE PROECT
In this circuit we can test two most common ICs that is Timer IC555 and operational amplifier IC741, use 8 pin IC base for both timer and op-amp IC.
To check IC555 place the testing IC in base and watch the output LEDs. If the two output LEDs connected with pin number 3 glows alternately means the tested IC is good otherwise this can be a fault IC. By the same way if you testing IC741 means the output LED connected with IC741 should glow otherwise it can be a fault IC.

 1.9                                             PURPOSE OF THE PROJECT
The purpose of this device is to provide a simple, fast and accurate means of testing 555 timers and 741 op-amp ICs.

1.10                                                     METHODOLOGY
To achieve the aim and objectives of this work, the following are the steps involved:

• Study of the previous work on the project so as to improve it efficiency.
• Draw a block diagram.
• Test for continuity of components and devices,
• Design and calculation for the device was carried out.
• Studying of various component used in circuit.
• Construction of the circuit was carried out.
• Finally, the whole device was cased and final test was carried out.

1.11                                      PROJECT WORK ORGANISATION
The work is organized as follows: chapter one discuses the introductory part of the work, chapter two presents the literature review of the study,  chapter three describes the methods applied, chapter four discusses the results of the work, chapter five summarizes the research outcomes and the recommendations.

CHAPTER TWO: The complete chapter two of “construction of 555 timers and 741 ic tester” is available. Order full work to download. Chapter two of “construction of 555 timers and 741 ic tester” consists of the literature review. In this chapter all the related work on “construction of 555 timers and 741 ic tester"

CHAPTER THREE: The complete chapter three of “construction of 555 timers and 741 ic tester” is available. Order full work to download. Chapter three of “construction of 555 timers and 741 ic tester” consists of the methodology. In this chapter all the method used in carrying out this work was discussed.

CHAPTER FOUR: The complete chapter four of construction of 555 timers and 741 ic tester” is available. Order full work to download. Chapter four of “construction of 555 timers and 741 ic tester” consists of all the test conducted during the work and the result gotten after the whole work

CHAPTER FIVE: The complete chapter five of design and construction of a “construction of 555 timers and 741 ic tester” is available. Order full work to download. Chapter five of “construction of 555 timers and 741 ic tester” consist of conclusion, recommendation and references.

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